Updating Kokkos lib

lib/kokkos/containers/unit_tests/TestSerial.cpp

@@ -58,7 +58,6 @@
 #include <TestStaticCrsGraph.hpp>
 #include <TestVector.hpp>
 #include <TestDualView.hpp>
-#include <TestSegmentedView.hpp>
 #include <TestDynamicView.hpp>
 #include <TestComplex.hpp>
 
@@ -67,6 +66,9 @@
 #include <Kokkos_DynRankView.hpp>
 #include <TestDynViewAPI.hpp>
 
+#include <Kokkos_ErrorReporter.hpp>
+#include <TestErrorReporter.hpp>
+
 namespace Test {
 
 class serial : public ::testing::Test {
@@ -135,11 +137,6 @@ TEST_F( serial, bitset )
     test_dualview_combinations<int,Kokkos::Serial>(size);               \
   }
 
-#define SERIAL_SEGMENTEDVIEW_TEST( size )                               \
-  TEST_F( serial, segmentedview_##size##x) {                            \
-    test_segmented_view<double,Kokkos::Serial>(size);                   \
-  }
-
 SERIAL_INSERT_TEST(close, 100000, 90000, 100, 500, true)
 SERIAL_INSERT_TEST(far, 100000, 90000, 100, 500, false)
 SERIAL_FAILED_INSERT_TEST( 10000, 1000 )
@@ -148,7 +145,6 @@ SERIAL_DEEP_COPY( 10000, 1 )
 SERIAL_VECTOR_COMBINE_TEST( 10 )
 SERIAL_VECTOR_COMBINE_TEST( 3057 )
 SERIAL_DUALVIEW_COMBINE_TEST( 10 )
-SERIAL_SEGMENTEDVIEW_TEST( 10000 )
 
 #undef SERIAL_INSERT_TEST
 #undef SERIAL_FAILED_INSERT_TEST
@@ -156,7 +152,6 @@ SERIAL_SEGMENTEDVIEW_TEST( 10000 )
 #undef SERIAL_DEEP_COPY
 #undef SERIAL_VECTOR_COMBINE_TEST
 #undef SERIAL_DUALVIEW_COMBINE_TEST
-#undef SERIAL_SEGMENTEDVIEW_TEST
 
 TEST_F( serial , dynamic_view )
 {
@@ -168,6 +163,19 @@ TEST_F( serial , dynamic_view )
   }
 }
 
+#if defined(KOKKOS_CLASS_LAMBDA)
+TEST_F(serial, ErrorReporterViaLambda)
+{
+  TestErrorReporter<ErrorReporterDriverUseLambda<Kokkos::Serial>>();
+}
+#endif
+
+TEST_F(serial, ErrorReporter)
+{
+  TestErrorReporter<ErrorReporterDriver<Kokkos::Serial>>();
+}
+
+
 } // namespace Test
 
 #endif // KOKKOS_HAVE_SERIAL